NDLI: Statistical analysis of back surface vs. cell temperatures of c-Si modules using measurement error models

Content Provider	IEEE Xplore Digital Library
Author	Kuitche, J.M. Rong Pan TamizhMani, G.
Copyright Year	2012
Description	Author affiliation: Arizona State University, Mesa, 85212, USA (Kuitche, J.M.; Rong Pan; TamizhMani, G.)
Abstract	The thermal characteristics of photovoltaic (PV) modules have a significant impact on the performance of PV systems. Numerous models have been proposed to estimate the module operating temperature for predicting energy production. King et. al. [1] pointed out the uncertainty associated with thermal models. Direct measurement of module temperatures, the paper argues, can improve the accuracy of performance models for continuously predicting expected system performance. The accuracy of the direct measurement is equally critical. The back surface temperature is often measured, and then corrected to cell temperature by adding a correction factor. There is no standard guideline for determining the correction factor. As a result, module temperatures may vary from one reporting entity to another, with serious effect on manufacturer's the bottom line. As an example, the nominal operating cell temperature (NOCT) value is used in various incentive programs, including that of the California Energy Commission (CEC). A difference of 2°C could lead to a huge loss of revenues. In this paper, we used a statistical procedure to (1) examine the back-to-cell temperature correction for crystalline silicon modules at a reference irradiance level of 1000 $W/m^{2},$ and (2) derive the relationship between the temperature difference and the irradiance. In doing so, we obtain a confidence bound for the correction factor, and quantify the impact on the NOCT value.
Starting Page	002953
Ending Page	002956
File Size	1155952
Page Count	4
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6318204
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Measurement uncertainty Temperature distribution Temperature sensors Measurement errors Silicon photovoltaic modules module temperature NOCT
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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