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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lulu Zhang Shu, B. Birkmire, R. Hegedus, S. Das, U. |
| Copyright Year | 2012 |
| Description | Author affiliation: Institute of Energy Conversion, University of Delaware, Newark, USA (Lulu Zhang; Shu, B.; Birkmire, R.; Hegedus, S.; Das, U.) |
| Abstract | Based on potential high efficiency, low thermal budget and compatibility with very thin Si wafers, many research groups and industries are considering interdigitated all back contact silicon heterojunction (IBC-SHJ) solar cell technology. Compared to front junction silicon heterojunction (FJ-SHJ) solar cells, IBC-SHJ cells also have the unique advantages for simpler module integration. However, the IBC-SHJ solar cells to date suffer with low fill factors. Both simulation and experimental results have been conducted to understand the cause of the low FF. In this paper, the effects of processing conditions are discussed by comparing FJ-SHJ and IBC-SHJ solar cells. The fabrication of IBC-SHJ cells requires several photolithography steps to form the interdigitated back structure, whereas the FJ-SHJ requires no photolithography steps. The effect of processing temperatures, deposition sequence and photolithography processing are evaluated by using the FJ-SHJ as a test bed and base-line standard. Contamination and/or introduction of defects at intrinsic/doped layer interfaces resulting from photolithography steps is identified as one of the major contributors to reduced performance of IBC-SHJ devices fabricated using a low temperature process. |
| Starting Page | 001177 |
| Ending Page | 001181 |
| File Size | 1048095 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781467300643 |
| ISSN | 01608371 |
| e-ISBN | 9781467300667 |
| DOI | 10.1109/PVSC.2012.6317811 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-03 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Photovoltaic cells Surface treatment Lithography Silicon Heterojunctions Resists Contamination photovoltaic cells silicon heterojunction surface contamination |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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