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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Young, D.L. Grover, S. Teplin, C. Stradins, P. LaSalvia, V. Ta-Ko Chuang Couillard, J.G. Branz, H.M. |
| Copyright Year | 2012 |
| Description | Author affiliation: National Renewable Energy Laboratory, Golden, CO, USA (Young, D.L.; Grover, S.; Teplin, C.; Stradins, P.; LaSalvia, V.; Branz, H.M.) || Corning Incorporated, NY, USA (Ta-Ko Chuang; Couillard, J.G.) |
| Abstract | We report characterization of epitaxial film crystal silicon (c-Si) solar cells with open-circuit voltages (V) above 560 mV. The 2-um absorber cells are grown by low-temperature (<750 °C) hot-wire CVD (HWCVD) on $Corning^{®}$ EAGLE $XG^{®}$ display glass coated with a layer-transferred (LT) Si seed. The high V is a result of low-defect epitaxial Si (epi-Si) growth and effective hydrogen passivation of defects. The quality of epitaxial growth by HWCVD on seeded glass substrates depends on the crystallographic quality of the seed and the morphology of the growth surface. Complete heterojunction cells consist of glass/c-Si LT seed/ epi $n^{+}$ Si:P/epi $n^{−}$ Si:P/intrinsic $a-Si:H/p^{+}$ a-Si:H/ITO. Similar devices grown on electronically ‘dead’ $n^{+}$ wafers have given V ∼ 630 mV and ∼8% efficiency with no light trapping features. Here we study the effects of the seed surface polish on epi-Si quality, how hydrogenation influences the device character, and the dominant junction transport physics. |
| Starting Page | 001841 |
| Ending Page | 001844 |
| File Size | 1624494 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467300643 |
| ISSN | 01608371 |
| e-ISBN | 9781467300667 |
| DOI | 10.1109/PVSC.2012.6317952 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-03 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Epitaxial growth Silicon Glass Substrates Rough surfaces Surface roughness solar energy epitaxial layers glass silicon |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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