NDLI: Optical modeling of the internal back reflectance of various c-Si dielectric stacks featuring AlO, SiN, TiO and SiO

Content Provider	IEEE Xplore Digital Library
Author	Davis, K.O. Seigneur, H.P. Jiang, K. Demberger, C. Zunft, H. Haverkamp, H. Habermann, D. Schoenfeld, W.V.
Copyright Year	2012
Description	Author affiliation: CREOL, College of Optics and Photonics, University of Central Florida, Orlando, U.S. (Jiang, K.; Demberger, C.; Zunft, H.; Haverkamp, H.; Habermann, D.) \|\| Florida Solar Energy Center, University of Central Florida, Cocoa, U.S. (Davis, K.O.; Seigneur, H.P.; Schoenfeld, W.V.)
Abstract	One promising path to a reduced cost of crystalline silicon (c-Si) photovoltaics (PV) is to increase silicon usage efficiency by using thinner wafers. Many challenges arise when transitioning to thin wafer cells, including increased surface recombination at the rear side of the cell, increased wafer bowing, and a reduction in optical absorption due to a decreased optical path length within the silicon. Rear side passivation provides great promise in addressing these challenges. This paper addresses rear side dielectric configurations that can optimize back surface reflectance, in addition to providing excellent surface passivation. Optical modeling of various stack configurations is examined to explore the back surface reflectance at the Si-dielectric interface for different film combinations and thicknesses as a function of wavelength and internal angle of incidence. Specifically, configurations using aluminum oxide (AlO), silicon nitride (SiN), titanium dioxide (TiO), and silicon dioxide (SiO) were investigated with a focus on designing stack configurations that will also allow for high quality passivation and are compatible with a high-volume manufacturing environment.
Starting Page	001032
Ending Page	001035
File Size	1329752
Page Count	4
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317779
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectrics Silicon Photovoltaic cells Reflectivity Passivation Optical films Optical reflection
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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