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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zongcun Liang Fei Zeng Shuquan Chen Hui Shen |
| Copyright Year | 2012 |
| Description | Author affiliation: Institute for Solar Energy System, State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-Sen University, Guangzhou, 510275, China (Zongcun Liang; Fei Zeng; Shuquan Chen; Hui Shen) |
| Abstract | In this paper, the comparison of performance degradation between selective emitter (SE) solar cell and traditional homogenous emitter (HE) solar cell under encapsulation and outdoor light exposure was investigated. One-cell small module experiments show that the performance degradation under encapsulation is mainly determined by the J (short circuit current density) loss, which is calculated according to the EQE (external quantum efficiency) measurements for detail analyses, and SE one-cell module demonstrates a bigger J loss than HE module does. The 72-cell SE modules present a similar power loss rate as the HE modules after encapsulation. After 360 days' outdoor exposure, SE module demonstrates more power losses compared with HE module; nevertheless, SE PV module still has a larger maximum power than standard HE module. |
| Starting Page | 002400 |
| Ending Page | 002405 |
| File Size | 1278652 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781467300643 |
| ISSN | 01608371 |
| e-ISBN | 9781467300667 |
| DOI | 10.1109/PVSC.2012.6318081 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-03 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Helium Encapsulation Loss measurement Degradation Photovoltaic cells Etching Ink light induced degradation selective emitter solar cell performance degradation encapsulation quantum efficiency PV module |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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