NDLI: Evaluating TCO long-term performance by electrochemical corrosion test and residual film stress analysis

Content Provider	IEEE Xplore Digital Library
Author	Mei Wen Ricou, P.
Copyright Year	2012
Description	Author affiliation: Arkema Inc., King of Prussia, PA, USA (Mei Wen; Ricou, P.)
Abstract	To evaluate the long-term performance of transparent conductive oxides (TCOs) in thin-film PV applications, electrochemical corrosion testing was carried out on three fluorine-doped tin oxide films on glass. The test assesses the TCO's susceptibility to delamination in thin-film PV modules. One TCO tested passed the test and the other two failed the test due to delamination and cracking. An X-ray diffraction (XRD) technique was used to determine residual film stress of the TCO films. Compressive stress was found in all the TCO films. The lowest stress was at −723 MPa and the highest stress was at Ȓ1173 MPa. Films with higher residual stresses had more areas of delamination. It is proposed that sodium ions formed at the TCO/glass interface and water diffusion into the film from the electrochemical corrosion test initiate straight-sided blister formation or buckling. When the compressive residual stress in the film is high, buckling-driven delamination occurs. This work suggests that both the electrochemical corrosion test and the XRD film stress analysis may be useful methods to rank the long-term performance of TCOs.
Starting Page	001332
Ending Page	001335
File Size	1040179
Page Count	4
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317846
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Films Corrosion Delamination Glass Residual stresses Tin residual stress transparent conductive oxides TCO fluorine-doped tin oxide photovoltaic cells long-term performance electrochemical corrosion test
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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