NDLI: A study of thermal, voltage, and photoinduced effects on the external quantum efficiency of CuInGaSe (CIGS) photovoltaic devices

Content Provider	IEEE Xplore Digital Library
Author	Feist, R. Mills, M. Thompson, R.K. Ramesh, N.
Copyright Year	2012
Description	Author affiliation: Dow Solar, The Dow Chemical Company, Midland, MI 48667 USA (Feist, R.; Mills, M.; Thompson, R.K.; Ramesh, N.)
Abstract	The purpose of this study was to assess the performance of CuInGaSe (CIGS) solar cells ranging from 6.9 – 11.2% efficiency to identify means of improving device performance. One of the main drivers for this work was to take an independent look at elevated operating temperatures associated with BIPV products like Dow's POWERHOUSE™ shingle system for performance differences as a function of system operating temperature independent of increasing efficiency to help future product definition. For three of the four samples we observed a clear lack of dark-light current-voltage (JV) superposition and correspondingly via external quantum efficiency (EQE) measurements an electrical field dependent carrier collection response in the blue regime. By inference this performance indicates the presence of impurities in the device, likely in the CdS film that could present an opportunity to further improve the CIGS device performance.
Starting Page	001266
Ending Page	001270
File Size	1030728
Page Count	5
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317832
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Performance evaluation Photovoltaic cells USA Councils Electric variables measurement Indexes RNA photovoltaic cells CIGS external quantum efficiency
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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