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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yamaguchi, M. Bouzazi, B. Suzuki, H. Ikeda, K. Kojima, N. Ohshita, Y. |
| Copyright Year | 2012 |
| Description | Author affiliation: Toyota Technological Institute, Nagoya 468-8511, Japan (Yamaguchi, M.; Bouzazi, B.; Suzuki, H.; Ikeda, K.; Kojima, N.; Ohshita, Y.) |
| Abstract | We have been studying concentrator multi-junction solar cells under Japanese Innovative Photovoltaic R&D program since FY2008 and EU-Japan Collaborative Research on CPV since 2011. In order to realize 40% and 50% efficiency, new approaches for novel materials and structures are being studied. InGaAsN is one of appropriate materials for 4- or 5-junction solar cell configuration because this material can be lattice-matched to GaAs and Ge substrates. However, present InGaAsN single-junction solar cells have been inefficient because of low minority-carrier lifetime due to N-related recombination centers and low carrier mobility due to alloy scattering and non-homogeneity of N. Present (In)GaAsN single-junction solar cells have been inefficient because of low minority-carrier lifetime due to N-related recombination centers such as N-H-V, (N-N) and so on, and low carrier mobility due to alloy scattering and non-homogeneity of N. To solve above problems we have been developing the CBE technique. We have focused especially on the N incorporation in GaAsN thin films grown by CBE as a function of growth temperature and substrate orientation. We have also proposed a new flow-rate modulation CBE (FM-CBE) method in order to increase N incorporation and to reduce C and H incorporation in films. By adapting CBE technique to grow (In)GaAsN thin films, higher mobility and longer minority-carrier lifetime compared to those grown by the other growth methods have been achieved. According to these electrical properties, more than 15% efficiency is expected in CBE grown homo junction (In)GaAsN solar cell although only 7.2% efficiency (Jsc=15.1 $mA/cm^{2},$ Voc=0.662 V, FF=0.65) GaAsN single-junction cells have been obtained. To solve above problems, We have characterized deep levels in grown GaAsN films by DLTS and defect behaviors have been clarified. |
| Starting Page | 000831 |
| Ending Page | 000834 |
| File Size | 1189494 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467300643 |
| ISSN | 01608371 |
| e-ISBN | 9781467300667 |
| DOI | 10.1109/PVSC.2012.6317732 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-03 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Gallium arsenide Resistance Marine vehicles Concentrator Solar Cells III-V-N CBE Growth Defect Analysis Minority-carrier Lifetime |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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