NDLI: Impact of interface recombination on time resolved photoluminescence (TRPL) decays in CdTe solar cells (numerical simulation analysis)

Content Provider	IEEE Xplore Digital Library
Author	Kanevce, A. Kuciauskas, D. Gessert, T.A. Levi, D.H. Albin, D.S.
Copyright Year	2012
Description	Author affiliation: National Renewable Energy Laboratory, Golden, CO, USA (Kanevce, A.; Kuciauskas, D.; Gessert, T.A.; Levi, D.H.; Albin, D.S.)
Abstract	Using Sentaurus Device Software, we analyze how bulk and interface recombination affect time-resolved photoluminescence (TRPL) decays in CdTe solar cells. This modeling analysis could improve the interpretation of TRPL data and increase the possibility of rapid defect characterization in thin-film solar cells. By illuminating the samples with photons of two different wavelengths, we try to deduce the spatial origin of the dominant recombination loss. Shorter-wavelength photons will be more affected by the interface recombination and drift compared to the longer ones. Using the two-wavelength TRPL characterization method, it may be possible to determine whether a specific change in deposition process has affected the properties of interface or the bulk of the absorber.
Starting Page	000848
Ending Page	000853
File Size	1294030
Page Count	6
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317736
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Lighting Wavelength measurement Spontaneous emission Numerical models Charge carrier lifetime Semiconductor process modeling Charge carrier processes numerical simulations carrier lifetime CdTe interface recombination
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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