NDLI: Open-atmosphere structural depth profiling of multilayer samples of photovoltaic interest using laser-induced plasma spectrometry

Content Provider	IEEE Xplore Digital Library
Author	Palanco, S. Gabas, M. Ayala, L. Bijani, S. Barrigon, E. Algora, C. Rey-Stolle, I. Ramos-Barrado, J.R.
Copyright Year	2012
Description	Author affiliation: Instituto de Energía Solar-Universidad Politécnica de Madrid, Av. Complutense 30, 28040, Spain (Barrigon, E.; Algora, C.; Rey-Stolle, I.) \|\| Dpto. de Física Aplicada I, Lab. de Materiales y Superficies, Universidad de Málaga, 29071, Spain (Palanco, S.; Gabas, M.; Ayala, L.; Bijani, S.; Ramos-Barrado, J.R.)
Abstract	The present work aims to assess Laser-Induced Plasma Spectrometry (LIPS) as a tool for the characterization of photovoltaic materials. Despite being a well-established technique with applications to many scientific and industrial fields, so far LIPS is little known to the photovoltaic scientific community. The technique allows the rapid characterization of layered samples without sample preparation, in open atmosphere and in real time. In this paper, we assess LIPS ability for the determination of elements that are difficult to analyze by other broadly used techniques, or for producing analytical information from very low-concentration elements. The results of the LIPS characterization of two different samples are presented: 1) a 90 nm, Al-doped ZnO layer deposited on a Si substrate by RF sputtering and 2) a Te-doped GaInP layer grown on GaAs by Metalorganic Vapor Phase Epitaxy. For both cases, the depth profile of the constituent and dopant elements is reported along with details of the experimental setup and the optimization of key parameters. It is remarkable that the longest time of analysis was ∼10 s, what, in conjunction with the other characteristics mentioned, makes of LIPS an appealing technique for rapid screening or quality control whether at the lab or at the production line.
Starting Page	000432
Ending Page	000436
File Size	971070
Page Count	5
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317651
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Plasmas Spectroscopy Lips Laser beams Surface emitting lasers Free electron lasers Calibration in-situ surface analysis laser induced plasma spectrometry
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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