NDLI: Statistical analysis of commercial c-Si PV module photovoltaic efficiency distribution over 10-years period

Content Provider	IEEE Xplore Digital Library
Author	Kuitche, J.M. Sharma, V. Jaewon Oh Pan, R. TamizhMani, G.
Copyright Year	2012
Description	Author affiliation: Arizona State University, Mesa, 85212, USA (Kuitche, J.M.; Sharma, V.; Jaewon Oh; Pan, R.; TamizhMani, G.)
Abstract	PV modules are primarily rated at standard test conditions (STC), which corresponds to 1000 $W/m^{2}$ irradiance, 25°C cell temperature, and AM 1.5 spectrum. This paper presents the statistical analyses of efficiency data obtained for over 300 crystalline silicon modules from various manufacturers between 1999 and 2008. Modules were tested at Arizona State University. The objective is (1) to show how the rated efficiencies compare to the measured efficiencies (of manufacturers' supplied modules to a certification laboratory) at STC over time, and (2) to compare measured efficiencies under two other different test conditions: SOC (standard operating condition) and Low E (low irradiance). This paper presents three major findings related to: rated versus measured STC data on manufacturers' supplied modules to a certification laboratory; performance variability over time; and statistical significance of the efficiency increase over the time period considered.
Starting Page	002421
Ending Page	002425
File Size	1604369
Page Count	5
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6318085
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System-on-a-chip Silicon Testing Temperature MONOS devices Standards Certification module efficiency photovoltaic modules
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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