NDLI: Modeling distribution and impact of efficiency limiting metallic impurities in silicon solar cells

Content Provider	IEEE Xplore Digital Library
Author	Schubert, M.C. Schon, J. Michl, B. Abdollahinia, A. Warta, W.
Copyright Year	2012
Description	Author affiliation: Fraunhofer Institute for Solar Energy Systems ISE, Freiburg, Germany (Schubert, M.C.; Schon, J.; Michl, B.; Abdollahinia, A.; Warta, W.)
Abstract	Although metal impurities are known to limit the efficiency of solar cells especially for the case of multicrystalline silicon the quantitative prediction of carrier lifetime and cell parameters as a function of impurity concentration is complex. Metal point defects as well as precipitates of different sizes and spatial distribution contribute to the overall carrier recombination and thus lifetime and cell efficiency. Diffusion and firing steps significantly modify the concentration but also the distribution and configuration of metal impurities. This article presents our modeling results on iron and chromium impurities which take into account these effects and which consistently explain our experimental findings on metal impurity concentration, distribution, and configuration throughout solar cell processing. Together with a cell simulation which is based on injection dependent carrier lifetime results we have now a tool to quantitatively determine the impact of impurities on cell parameters.
Starting Page	000286
Ending Page	000291
File Size	1360327
Page Count	6
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317620
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Iron Chromium Silicon Computer architecture Impurities Temperature measurement Microprocessors impurities silicon modeling solar cells
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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