NDLI: Integrated electrical and optical characterization of large area thin film photovoltaic materials

Content Provider	IEEE Xplore Digital Library
Author	Szitasi, G. Korsos, F. Selmeczi, D. Takacs, O. Novinics, F. Tutto, P. Findlay, A. Wilson, M.
Copyright Year	2012
Description	Author affiliation: Semilab Semiconductor Physics Laboratory Co. Ltd., Budapest, H-1117, Hungary (Szitasi, G.; Korsos, F.; Selmeczi, D.; Takacs, O.; Novinics, F.; Tutto, P.; Findlay, A.; Wilson, M.)
Abstract	In thin film photovoltaic manufacturing, a number of different technologies are now used on an industrial scale: silicon-based thin films, CIS/CIGS-based thin films, CdTe-based films and other, more exotic materials and structures. Both during research and production control, there is a need for suitable characterization methods which can be applied directly to the panels in production. In this paper we present a range of advanced electrical and optical metrology techniques suitable for such thin film characterization. These measurements utilize a number of non-contact, non-destructive probes to determine material properties, and can be configured in a single flexible platform, to handle the large area substrates used in thin film production. We also present significant improvements achieved in the spectrally resolved haze and transmission measurements, where the improvement is the creation of an optical setup with a suitable integration sphere that enables these measurements without the usual need to measure a reference sample before the actual sample qualification, thus maintaining the advantages of an integrating sphere but reducing usual measurement time.
Starting Page	000474
Ending Page	000478
File Size	1302635
Page Count	5
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6317660
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical variables measurement Optical films Optical refraction Optical sensors Photonics Photovoltaic systems ellipsometry TCO materials thin film photovoltaics sheet resistance spectroscopic transmittance haze
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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