NDLI: Quantitative elemental analysis of photovoltaic Cu(In,Ga)Se thin films using $MCs^{+}$ clusters

Content Provider	IEEE Xplore Digital Library
Author	Kaufmann, K. Wahl, S. Meyer, S. Hagendorf, C.
Copyright Year	2012
Description	Author affiliation: Fraunhofer Center for Silicon Photovoltaics CSP, Halle (Saale), Saxony-Anhalt, 06114, Germany (Kaufmann, K.; Wahl, S.; Meyer, S.; Hagendorf, C.)
Abstract	In the process of optimizing solar cells a quantitative and depth-resolved elemental analysis of photovoltaic thin films is strongly required. Regarding Cu(In,Ga)Se (CIGS) thin film solar cells, depth dependent stoichometric changes of Ga and In are of great interest because the In/Ga ratio has a large effect on solar cell efficiencies. In this paper we investigate the elemental composition of CIGS thin film solar cells based on secondary ion intensities in Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) depth profiling, providing high sensitivities and high spatial resolution. Quantification of the data is obtained by comparison to X-ray Photoelectron Spectroscopy (XPS) depth profiles. The detection of $MCs^{+}-clusters$ is used for semiquantitative elemental analysis of CIGS thin films. Correlation plots of the intensities of $GaCs^{+}$ and $InCs^{+}$ indicate that there is no relevant matrix effect for In and Ga due to changes in stoichiometry in the layer. Additional high resolution Inductively Coupled Plasma Mass Spectrometry (ICP-MS) measurements show a strong correlation between the ratio of the bulk concentrations of Ga and In and the ratio of integrated ToF-SIMS intensities of $GaCs^{+}$ and $InCs^{+}$ therefore supporting the quantitative interpretation of $MCs^{+}$ data.
Starting Page	002647
Ending Page	002649
File Size	2567348
Page Count	3
File Format	PDF
ISBN	9781467300643
ISSN	01608371
e-ISBN	9781467300667
DOI	10.1109/PVSC.2012.6318139
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photovoltaic cells Photovoltaic systems Silicon Zinc oxide Ions Correlation quantification CIGS ToF-SIMS depth profiling ICP-MS
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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