NDLI: Next generation inline minority carrier lifetime metrology on multicrystalline silicon bricks for PV

Content Provider	IEEE Xplore Digital Library
Author	Schuler, N. Mittelstrass, D. Dornich, K. Niklas, J.R. Neuhaus, H.
Copyright Year	2010
Description	Author affiliation: Freiberg Instruments GmbH, Am St. Niclas Schacht 13, 09599 Freiberg, Germany (Schuler, N.; Mittelstrass, D.; Dornich, K.; Niklas, J.R.) \|\| Solar World Innovations GmbH, Berthelsdorfer Str. 111 A, 09599 Freiberg, Germany (Neuhaus, H.)
Abstract	In this paper the novel method MDP (microwave detected photoconductivity) [1–4] will be introduced to the field of contact less inline metrology at bricks. By the application of a widely advanced microwave detection technique, it is now possible to map minority carrier lifetime and photoconductivity simultaneously, with a so far unsurpassed combination of spatial resolution, sensitivity, and measurement speed. Beside these two parameters the iron concentration can be detected and analyzing the photoconductivity at steady state in comparison with the minority carrier lifetime, a lot of additional information can be derived. This paper will show first examples of minority carrier lifetime and photoconductivity maps, along with resistivity linescans and iron concentration maps of whole bricks measured inline. Furthermore simulations will be provided. Solving the transport equations for electrons and holes during the measurement at bricks, it can be proven that the measured effective lifetime deviates only lightly from the actual bulk lifetime. Furthermore it becomes clear that a steady state generation is more suited for brick measurements than non-steady state methods.
Starting Page	000852
Ending Page	000857
File Size	1195455
Page Count	6
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5617170
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Iron Photoconductivity Steady-state Charge carrier lifetime Microwave measurements Mathematical model
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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