NDLI: Interface analysis in CdTe/CdS solar cells

Content Provider	IEEE Xplore Digital Library
Author	Lita, B. Pavol, M.J. Dovidenko, K. Le Tarte, L.A. Ellis, D. Barbuto, T. Bansal, S. Smentkowski, V.S. Young, M. Asher, S.E.
Copyright Year	2010
Description	Author affiliation: PrimeStar Solar, Arvada, Colorado, USA (Lita, B.; Pavol, M.J.) \|\| National Renewable Energy Laboratory, Golden, Colorado, USA (Young, M.; Asher, S.E.) \|\| General Electric, Global Research Center, Niskayuna, New York, USA (Dovidenko, K.; Le Tarte, L.A.; Ellis, D.; Barbuto, T.; Bansal, S.; Smentkowski, V.S.)
Abstract	We present results of chemical composition analysis across CdTe/CdS interfaces using depth profiling in Auger electron spectroscopy (AES) and secondary ion mass spectrometry (SIMS). The analysis of these buried interfaces is typically challenging due to significant interface broadening due to CdTe initial roughness and developing roughness during depth profiling. We have developed two alternative methods for sample preparation, namely chemical etching and mechanical polishing, and we will present S conc. profiles obtained using both methods in samples grown with variable CdTe temperature. AES depth profiling near bottom of CdTe solar cells showed widening of S conc. profiles for the hottest CdTe as compared to the coldest CdTe. In addition, the peak S conc. decreases from the coldest to the hottest sample, suggesting that S out-diffusion from CdS is also temperature dependent. Finally we employ focused ion beam cross-sectioning and scanning electron microscopy to measure layer thicknesses, evaluate the success of the sample preparation methods, and to discuss the effects of interface roughness on S conc. profiles and Te-S interdiffusion.
Starting Page	001937
Ending Page	001942
File Size	2598908
Page Count	6
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5616219
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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