NDLI: Comparative study of various PV technologies in terms of energy yield and annual degradation

Content Provider	IEEE Xplore Digital Library
Author	Dhere, N.G. Pethe, S.A. Kaul, A.
Copyright Year	2010
Description	Author affiliation: Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, 32922, USA (Dhere, N.G.; Pethe, S.A.; Kaul, A.)
Abstract	Current accelerated tests of photovoltaic (PV) modules mostly prevent infant mortality but do not fully duplicate changes occurring in the field nor can predict useful lifetime. Therefore, monitoring of field-deployed thin film PV modules was undertaken at FSEC with goals to assess their performance in hot and humid climate under high voltage operation and to correlate the PV performance with the meteorological parameters. This paper presents performance analysis of a-Si:H and CIGS PV modules that were field deployed in the hot and humid climate over a period of approximately 30 months. The modules were connected in series so as to build maximum open circuit voltage of less than ±600 V with respect to ground and maintained at near maximum power point conditions. Statistical data analysis of PV parameters along with meteorological parameters that were continuously monitored is carried out on regular basis with PVUSA type regression analysis. Current-voltage (I–V) characteristic of module arrays that are obtained periodically complement the continuous data monitoring. The annual energy yield was calculated for both the PV technologies based on the data averaged over every fifteen minutes. Moreover, comparison of the two technologies was carried out based on the estimated annual degradation.
Starting Page	002899
Ending Page	002903
File Size	1206642
Page Count	5
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5614493
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Monitoring Q measurement Temperature sensors Current measurement Arrays Power measurement
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
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