NDLI: The low-loss plasmonic mode for light confinement in silicon-based thin-film solar cells

Content Provider	IEEE Xplore Digital Library
Author	Fu-Ji Tsai Jen-Hung Wang Chih-Hung Yeh
Copyright Year	2010
Description	Author affiliation: NexPower Technology Corporation, Taichung County 421, Taiwan (Fu-Ji Tsai; Jen-Hung Wang; Chih-Hung Yeh)
Abstract	In amorphous silicon (and its alloys) solar cells, because of the low carrier mobility and light induced degradation [1], a device of a thinner intrinsic layer has the advantage of higher carrier harvest in generating photocurrent. It is therefore critical to keep efficient absorption within limit thickness to both retain higher short-circuit current and filling factor of devices. Furthermore, the future trend of silicon-based thin film solar cells, double and triple junction solar cells, largely depends on micro-crystalline silicon layers. In order to enlarge market share, lowering the production cost though reducing the thickness of micro-crystalline silicon layers is the current interest in industry and academic research. Therefore, to keep a high level of photocurrent, thinner absorbing layers require efficient light management scheme [2,3]. One of the candidates, surface plasmon assisted light confinement, has been demonstrated feasible with slight improvement [4,5]. However, huge metallic loss in metal structures hinders further improvement in SPP-assisted thin film solar cells [6]. Owing to the existence of optical loss in metallic structures, we propose a numerical method to analysis a multilayer system incorporating low-loss plasmonic modes with better light confinement. Meanwhile, we estimate the light-trapping effect in the textured transparent conducting oxide (TCO) which plays a coupling medium between sunlight and confined modes in solar cells.
Starting Page	001581
Ending Page	001585
File Size	1679098
Page Count	5
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5617130
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical scattering Integrated optics Conductivity Optical coupling Silicon Optical surface waves
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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