NDLI: Effect of the Mo back contact microstructure on the preferred orientation of CIGS thin films

Content Provider	IEEE Xplore Digital Library
Author	Ju-Heon Yoon Kwan-Hee Yoon Jong-Keun Kim Won-Mok Kim Jong-Keuk Park Taek Sung Lee Young-Joon Baik Tae-Yeon Seong Jeung-hyun Jeong
Copyright Year	2010
Description	Author affiliation: Department of Materials Science and Engineering, Korea University, Seoul 136-701, Korea (Tae-Yeon Seong) \|\| Electronic Materials Center, Korea Institute of Science and Technology, Seoul 136-791, Korea (Won-Mok Kim; Jong-Keuk Park; Taek Sung Lee; Young-Joon Baik) \|\| Solar Cell Center, Korea Institute of Science and Technology, Seoul 136-791, Korea (Ju-Heon Yoon; Kwan-Hee Yoon; Jong-Keun Kim; Jeung-hyun Jeong)
Abstract	The effect of varying microstructures of Mo films on CIGS preferred orientation has been studied by changing Mo working pressure (in sputtering). CIGS I(220)/I(112) and IGS I(300)/I(006) have strong dependencies of the residual stress of Mo closely related to its microstructures: they increases with Mo pressure and then gradually decreases with Mo pressure, as the residual stress does. The trend is exactly opposite to the known effect due to Na. Thus this work shows that Mo microstructure itself can determine IGS and CIGS textures without assistance of other factors such as Na. XRD analysis on selenized Mo and TEM work on IGS/Mo show that MoSe reactivity itself influences the IGS texture more than its orientation. In addition, MoSe reactivity depends on the in-grain density of Mo which is linearly related to the residual stress.
Starting Page	002443
Ending Page	002447
File Size	1332154
Page Count	5
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5614175
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Lead Substrates Stress Films
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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