NDLI: Intrinsic stability of thin-film CdS/CdTe modules

Content Provider	IEEE Xplore Digital Library
Author	Demtsu, S. Bansal, S. Albin, D.
Copyright Year	2010
Description	Author affiliation: PrimeStar Solar, Arvada, CO, USA (Demtsu, S.) \|\| National Renewable Energy Laboratory, Golden, CO, USA (Albin, D.) \|\| General Electric Global Research Center, Niskayuna, NY, USA (Bansal, S.)
Abstract	Stability of thin-film CdTe module is crucial to the advancement of the technology. Long-term stability studies are carried out under a variety of accelerated test conditions. Accelerated-life-tests (ALT) are performed in the laboratory to accelerate degradation and hence quantify performance change in reasonably short periods of time. ALT studies attempt to simulate the conditions a solar module experiences outdoors during its lifetime, and ALT results are correlated to outdoor test results to estimate module service lifetimes, nameplate parameters, and product warranty. To accelerate degradation, laboratory experiments are often performed at elevated temperature, voltage bias and under continuous illumination. In this study laboratory size cells (0.5 $cm^{2}),$ mini-modules (15 cm × 15 cm) and full-size encapsulated modules (60 cm × 120 cm) that consist of monolithically interconnected cells were subjected to different levels of illumination, elevated temperatures and electrical biases for extended periods of time. Changes in efficiency, fill-factor (FF), open-circuit voltage (V) and short-circuit current (I) as a function stress time and stress conditions are discussed.
Starting Page	001161
Ending Page	001165
File Size	884142
Page Count	5
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5614753
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stress Degradation Resistance Photovoltaic cells Thermal stability Lighting Life estimation
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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