NDLI: Status of 40% production efficiency concentrator cells at Spectrolab

Content Provider	IEEE Xplore Digital Library
Author	Jones, R.K. Hebert, P. Pien, P. King, R.R. Bhusari, D. Brandt, R. Al Taher, O. Fetzer, C. Ermer, J. Boca, A. Larrabee, D. Liu, X.Q. Karam, N.
Copyright Year	2010
Description	Author affiliation: Spectrolab, Inc., a wholly-owned subsidiary of the Boeing Company, Sylmar, California, USA (Jones, R.K.; Hebert, P.; Pien, P.; King, R.R.; Bhusari, D.; Brandt, R.; Al Taher, O.; Fetzer, C.; Ermer, J.; Boca, A.; Larrabee, D.; Liu, X.Q.; Karam, N.)
Abstract	Multijunction solar cells based on III–V semiconductors are the most efficient solar cells in the world, and of the established photovoltaic technologies, have the greatest potential for future growth in efficiency. Champion cells with efficiency greater than 40% have been demonstrated by several groups since 2006, and in that same period, the efficiency of cells in mass production has also increased steadily. These devices offer the promise of very competitive solar power systems exploiting the high efficiency under high optical concentration. To this end, Spectrolab is conducting a multi-year program to develop solar cells with still higher efficiency and substantial cost reductions and to fully characterize and qualify them for reliable performance in the field. Development of the fourth production generation with 40% average production efficiency is nearing completion. Cell design and performance will be presented, with a summary of qualification and field test status. Progress in ongoing efforts to automate cell production for cost reduction and increased manufacturing capacity will be discussed. Development of these high-performance multijunction CPV cells is key to the emergence of CPV technology as the lowest cost solar power solution in high DNI areas.
Starting Page	000189
Ending Page	000195
File Size	2096746
Page Count	7
File Format	PDF
ISBN	9781424458905
ISSN	01608371
e-ISBN	9781424458929
DOI	10.1109/PVSC.2010.5614535
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Periodic structures Testing Logic gates
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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