NDLI: A dual threshold method to independently control spatial resolution and sensitivity in β imaging

Content Provider	IEEE Xplore Digital Library
Author	Cabello, J. Bailey, A. Kitchen, I. Turchetta, R. Wells, K.
Copyright Year	2008
Description	Author affiliation: University of Surrey, Guildford, Surrey, UK (Cabello, J.; Bailey, A.; Kitchen, I.; Wells, K.) \|\| Rutherford Appleton Laboratory, Oxfordshire, UK (Turchetta, R.)
Abstract	A wide variety of digital alternatives have been presented to replace traditional film emulsion as detection medium in β- Autoradiography. The main claim of most of the alternatives is higher sensitivity. On the other hand, spatial resolution remains the main problem to solve to be able to offer a sensible alternative to film. Solid state detectors, mainly made of silicon, are being used very actively in many disciplines in Medicine and Biology. Spatial resolution is significantly dependant on the pixel size for digital detectors. If charge deposition from impinging β- particles causes cross-talk between neighbour pixels, and accurate charge deposited is measured, sub-pixel resolution can be obtained, therefore potentially obtaining spatial resolution comparable to traditional film. In order to investigate this, a dual threshold approach is presented here, validated with Monte Carlo simulations. Using this approach better charge measurement is obtained, and even some background events are discarded, reducing the global noise level of the detector.
Starting Page	1
Ending Page	7
File Size	3852208
Page Count	7
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.5075458
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Spatial resolution Detectors Charge measurement High-resolution imaging Solid state circuits Silicon Biomedical imaging Current measurement Particle measurements Noise level monolithic CMOS technology Digital Autoradiography
Content Type	Text
Resource Type	Article

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