NDLI: Simulation studies of CdTe pixel detectors

Content Provider	IEEE Xplore Digital Library
Author	Lambropoulos, C. P. Karafasoulis, K. E. Gnatyuk, V. A. Levytskyi, S.
Copyright Year	2008
Description	Author affiliation: Electronics Sensors and Communications Laboratory and the Aircraft Technology Department, Technological Educational Institute of Chalkida, Psahna-Evia, 34400 Greece (Lambropoulos, C. P.) \|\| National Academy of Sciences of Ukraine, VE Lashkaryov Institute of Semiconductor Physics, Kiev, UA-03028 Ukraine (Levytskyi, S.) \|\| Electronics Sensors and Communications Laboratory, Technological Educational Institute of Chalkida, Psahna-Evia, 34400 Greece (Karafasoulis, K. E.) \|\| Shizuoka University, Research Institute of Electronics, 3-5-1 Johoku, Hamamatsu, Shizuoka 4328011 Japan (Gnatyuk, V. A.)
Abstract	We have performed simulation studies of CdTe pixel detectors using the commercial SDEVICE simulator by SYNOPSYS. We have incorporated energy levels and concentrations of defects in the band gap using the information by published compensation models. We have performed I–V simulation experiments. We simulated the transient behavior of the detectors due to the bombardment with alpha particles and X-ray photons. The simulation of the interaction with alpha particles required the description of the dependency on energy of the Bragg peak in CdTe, which we included in the material database file of CdTe. We investigated the relation of the charge collected at neighbor pixels with the depth of interaction of X ray quanta. The study has the following purposes: (a) To provide realistic current waveforms as input to electronics simulations needed for the development of pixel readout electronics. (b) To evaluate methods for the extraction of the depth of interaction. (c) To incorporate to this device simulator as much detailed information as possible about the material, about the electrodes and about the defects that degrade its performance and explore through numerical simulation their effect on charge collection.
Starting Page	269
Ending Page	271
File Size	2177887
Page Count	3
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4775166
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Alpha particles Energy states Photonic band gap X-ray detection X-ray detectors Databases Readout electronics Data mining Electrodes Degradation
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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