NDLI: Some studies on electrical behaviour of red mercuric iodide single crystals

Content Provider	IEEE Xplore Digital Library
Author	Sharma, S. L. Behera, S. P. Thakur, A. K.
Copyright Year	2008
Description	Author affiliation: Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur 721302, INDIA (Sharma, S. L.; Behera, S. P.; Thakur, A. K.)
Abstract	Red mercuric iodide (α-HgI) has attracted considerable interest in the last over three decades or so due to its applicability in room temperature detection of X-rays and rays-rays. The single crystal plates of α-HgI are used as solid-state ionization chambers for the detection of X-rays and low energy γ-rays and as photodetectors in conjunction with several scintillating materials in the scintillator-based gamma ray spectrometers. In these applications, a single crystal plate of α-HgI is sandwiched in between two parallel electrodes to produce a device. Several techniques have been used in the past to study electrical, optoelectronic and radiation detection properties of such devices. However, no attempt is made in the past to understand the behaviour of such a device under alternating electric fields. Also, no attempt is made in the past to understand the effect of frequency and temperature on the dielectric properties of this material. In the present paper, we are reporting the results of our investigations on electrical behaviour of some α-HgI single crystals obtained using complex impedance spectroscopy. The frequency and temperature dependences of the electrical properties of the α-HgI single crystals have also been obtained for the first time. These results will be presented and discussed for a better understanding of the electrical behaviour of radiation detectors made of this material.
Starting Page	197
Ending Page	201
File Size	1440162
Page Count	5
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4775152
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Crystals Crystalline materials Temperature X-ray detection X-ray detectors Radiation detectors Frequency Solid state circuits Ionization chambers Gamma ray detection
Content Type	Text
Resource Type	Article

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