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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Clark, Andy T. Guerrini, Nicola Allinson, Nigel Bohndiek, Sarah E. Crooks, Jamie Pickering, Tim Turchetta, Renato |
| Copyright Year | 2008 |
| Description | Author affiliation: The University of Sheffield, S1 3JD, U.K. (Allinson, Nigel) || CMOS Sensor Design Group, Rutherford Appleton Laboratory, Didcot OX11 0QX, U.K. (Clark, Andy T.; Guerrini, Nicola; Crooks, Jamie; Pickering, Tim; Turchetta, Renato) || Department of Medical Physics and Bioengineering, University College London, WC1E 6BT, U.K. (Bohndiek, Sarah E.) |
| Abstract | A large area, 54 mm x 54 mm 1.8Megapixel CMOS image sensor was designed for scientific applications such as X-ray diffraction studies and direct medical X-ray imaging. Both applications have a requirement for large sensing area combined with a high dynamic range. The sensor was manufactured using stitching techniques in order to achieve a large, scalable design. The boundary between stitched sections is seamless, with no lost pixel space. Ten parallel outputs are used to enable a frame rate of up to 20 frames per second with full frame readout. Further increases in speed are possible by defining a region of interest. |
| Starting Page | 4540 |
| Ending Page | 4543 |
| File Size | 5920232 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424427147 |
| ISSN | 10957863 |
| DOI | 10.1109/NSSMIC.2008.4774299 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-10-19 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | CMOS image sensors Biomedical imaging Optical imaging Dynamic range X-ray diffraction X-ray imaging Image sensors Manufacturing Quantum capacitance X-ray detection |
| Content Type | Text |
| Resource Type | Article |
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