NDLI: Simultaneous acquisition of K-edge subtraction images using a pnCCD

Content Provider	IEEE Xplore Digital Library
Author	Nurdan, K. Conka Nurdan, T. AlTaani, M. Yousef, H. Walenta, A.H. Walenta, K. Abboud, A. Nasr, A. Rubsamen, O. Schenk, W. Pietsch, U. Send, S. Hartmann, R. Leitenberger, W. Struder, L.
Copyright Year	2008
Description	Author affiliation: Physics Department, University of Siegen, Germany (Nurdan, K.; Conka Nurdan, T.; AlTaani, M.; Yousef, H.; Walenta, A.H.; Abboud, A.; Nasr, A.; Rubsamen, O.; Schenk, W.; Pietsch, U.; Send, S.; Struder, L.) \|\| Physics Department, University of Potsdam, Germany (Leitenberger, W.) \|\| PNSensor GmbH, Munich, Germany (Hartmann, R.) \|\| Department of Internal Medicine III, University Hospital of the Saarland, Homburg, Germany (Walenta, K.)
Abstract	The recent developments in the semiconductor detector technology, in particular the pnCCD, makes it possible to measure energy and position of X-rays after scattering with the specimen at the same time. An interesting application for such a device is the measurement of a contrast medium in vivo or in vitro using the K-edge subtraction method. The pnCCD detectors developed at the semiconductor laboratory of Max-Planck-Institute are well suited for such applications. They show very high quantum efficiencies in the energy range between 1–15 keV and can be used in a single photon counting mode. The pnCCD used for these experiments comprises 256×256 pixels with a pixel size of 75×75 $μm^{2}$ and is equipped with a special analog frame buffer for high speed applications.
Starting Page	3965
Ending Page	3969
File Size	9880759
Page Count	5
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4774151
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray detection X-ray detectors Energy measurement Position measurement Particle measurements Time measurement Electromagnetic scattering Particle scattering X-ray scattering In vivo K-Edge Subtraction pnCCD
Content Type	Text
Resource Type	Article

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