NDLI: Partial scan with shifted detector: A novel weighting function for high temporal resolution in CT

Content Provider	IEEE Xplore Digital Library
Author	Maass, Clemens Knaup, Michael Lapp, Robert Karolczak, Marek Kalender, Willi A. Kachelriess, Marc
Copyright Year	2008
Description	Author affiliation: Institute of Medical Physics (IMP), University of Erlangen-Nürnberg, Henkestr. 91, 91052, Germany (Maass, Clemens; Knaup, Michael; Karolczak, Marek; Kalender, Willi A.; Kachelriess, Marc) \|\| VAMP GmbH, Erlangen, Germany (Lapp, Robert)
Abstract	The size of the field of measurement (FOM) in computed tomography is limited by the size of the x-ray detector. To enlarge the FOM one may laterally shift the detector by up to 50% of its size and apply well-known weighting functions to the rawdata prior to convolution and backprojection. In this case a full scan is required to obtain complete data though there is a small region, the inner FOM, that is covered redundantly and where a partial scan reconstruction may be sufficient. We propose a new weighting function that allows to reconstruct partial scans in that inner FOM while it reconstructs full scan or overscan data for the outer FOM that contains no redundancies. Thereby we can achieve a high temporal resolution in the inner FOM while maintaining truncation-free images for the outer part. Our approach is evaluated with simulated data using the geometry of a dual source micro-CT scanner with rotating gantry. The result is a doubled temporal resolution in the inner FOM without loss of image quality due to truncation or transition artifacts. Noise and spatial resolution in the inner FOM are equal to reconstructions using a detector that fully covers the FOM. The partial scan window can be arbitrarily shifted in the angular direction, which corresponds to shifting the temporal window of the data shown in the inner FOM. This feature allows dynamic CT studies with high temporal resolution and shifted detector and to reduce patient dose.
Starting Page	597
Ending Page	601
File Size	6941503
Page Count	5
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4775121
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image reconstruction Computed tomography X-ray detectors Image resolution Spatial resolution X-ray detection Size measurement X-ray imaging Convolution Solid modeling CT Reconstruction CBCT Micro-CT
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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