NDLI: Monte Carlo time domain noise simulation in nuclear electronics

Content Provider	IEEE Xplore Digital Library
Author	Redus, Robert H. Huber, Alan C.
Copyright Year	2008
Description	Author affiliation: Amptek, Inc., 14 DeAngelo Dr, Bedford, MA 01730 USA (Redus, Robert H.; Huber, Alan C.)
Abstract	Since radiation detectors and associated electronics operate on pulses, time domain or transient simulations are used but neglect electronic noise. Traditional noise analysis yields the rms magnitude of noise fluctuations but does not show how noise affects time-variant or nonlinear circuits. These effects are not well described by either noise-free time domain analyses or noise analyses, which yield only the rms magnitude of the noise. We have developed software that produces a time domain simulation, which represents electronic noise as a randomly varying waveform. The waveform is simulated as a superposition of random noise impulses into the preamplifier, with the appropriate noise weighting functions and with amplitude and frequency derived from the electrical parameters of the circuitry. The result has an accurate rms amplitude and frequency spectrum, including white series noise, white parallel noise, and series 1/f noise terms. The software combines this random electronic noise, time variant processes such as variations in detector risetime or pulse pile-up, and models both time-invariant and time-variant circuitry. It provides a physically intuitive and quantitative connection between noise sources, noise weighting functions, and a noisy waveform. This software was been used in designing the latest generation of Amptek’s digital processor but is generally applicable for many different systems.
Starting Page	3421
Ending Page	3429
File Size	2696986
Page Count	9
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4775076
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Monte Carlo methods Nuclear electronics Circuit noise Noise level Circuit simulation Frequency White noise Radiation detectors Fluctuations Nonlinear circuits
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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