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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Nillius, Peter Danielsson, Mats |
| Copyright Year | 2008 |
| Description | Author affiliation: Department of Physics, Royal Institute of Technology (KTH), SE-106 91 Stockholm, Sweden (Nillius, Peter; Danielsson, Mats) |
| Abstract | The pinhole geometry in SPECT has an inherent trade-off between resolution and sensitivity. High resolution requires a small aperture which on the other hand directly reduces the rate of detected photons. Recent systems overcome this to some extent by using multiple pinholes spread out around the imaging object, effectively increasing the sensitivity with a factor equal to the number of pinholes. The images of each pinhole must fit on the detector without overlap. This creates another trade-off between resolution, sensitivity and the field-of-view (FOV) of the system. |
| Starting Page | 5020 |
| Ending Page | 5022 |
| File Size | 3825474 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781424427147 |
| ISSN | 10957863 |
| DOI | 10.1109/NSSMIC.2008.4774368 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-10-19 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Geometry Detectors Cameras High-resolution imaging Apertures Collimators Single photon emission computed tomography Upper bound Positron emission tomography Image resolution |
| Content Type | Text |
| Resource Type | Article |
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