NDLI: Characterization of a γ-ray detection system based on a CsI(Tl) scintillator coupled to a silicon PiN diode

Content Provider	IEEE Xplore Digital Library
Author	Fazzi, A. Rossi, A. Pirovano, C. Rozzi, D. Varoli, V. Pignatel, G. U. Corsi, F. Carrato, S. Dalla Betta, G-F. Garibaldi, F.
Copyright Year	2008
Description	Author affiliation: Istituto Superiore di Sanità, v.le Regin Elena 200, 00100 Roma, Italy (Garibaldi, F.) \|\| Nuclear Electronic Lab. of CeSNEF-Department of Energy, Politecnico di Milano, via Ponzio 34/3, I-20133, Italy (Fazzi, A.; Rossi, A.; Pirovano, C.; Rozzi, D.; Varoli, V.) \|\| DEE, Polytechnic of Bari, v. Orabona 4, 70125, Italy (Corsi, F.) \|\| DIEI, University of Perugia, v. Duranti 93, 06125, Italy (Pignatel, G. U.) \|\| DIT, University of Trento, v. Sommarive 14, 38050 Povo (TN), Italy (Dalla Betta, G-F.) \|\| DEEI, University of Trieste, v. Valerio 10, 34100, Italy (Carrato, S.)
Abstract	As a step towards the realization of a γ-ray 8x8 modular imaging probe, the single pixel element has been extensively tested. It consists of a 6.1 $mm^{2}$ x 3.7 mm CsI(Tl) scintillation crystal optically coupled to the backside of a 3.6 $mm^{2}$ PiN diode on a 300 um fully depleted silicon wafer. The γ-ray detection system has been irradiated with the radio-isotopes: $^{241}Am,$ $^{99m}Tc,$ $^{152}Eu$ and $^{137}Cs$ to span the energy range between 60 and 1400 keV. The linearity of the response is very good and the total conversion efficiency is 0.45. The dependence of the energy resolution on the electronic noise has been simulated and compared with experimental values. The intrinsic resolution of the crystal is about 6% and the ENC about 200 rms electrons. The resolution on the 140 keV line of the $^{99m}Tc$ and the 660 keV line of the $^{137}Cs$ are 19% and 7.4%, respectively.
Starting Page	2424
Ending Page	2428
File Size	4212548
Page Count	5
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4774844
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Energy resolution Solid scintillation detectors Optical imaging Probes Pixel Testing Optical coupling Linearity Electrons
Content Type	Text
Resource Type	Article

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