NDLI: SPICE model for radiation hard silicon detectors

Content Provider	IEEE Xplore Digital Library
Author	Long, Li Roder, Ralf
Copyright Year	2008
Description	Author affiliation: CiS Forschungsinstitut für Mikrosensorik und Photovoltaik GmbH, Konrad-Zuse-Str.14, D-99099, Erfurt, Germany (Long, Li; Roder, Ralf)
Abstract	A SPICE model is proposed for the silicon radiation detectors experienced different irradiation doses and annealing processes. A windows program is developed to calculate the parameters of the SPICE model for any given irradiation scenario and automatically generate the SPICE model library. It includes the effects of radiation damages induced leakage current, effective acceptors and trapping. The mechanism of signal formation due to electron-hole generation and carrier trapping, the effect of finite detector thickness for leakage current and capacitance and the detector noise are implemented. The simulated or empirical values of implant strip resist, metal resist, coupling capacitance, inter strip capacitance and resistance are also incorporated for microstrip and pixel detectors. Therefore the charge collection efficiency, the signal noise ratio, the power consumption and for microstrip and pixel detectors the signal spread between adjacent cells and noise reduction of the distributed strip metal resistance for detector receiving any given irradiation dose and experienced any annealing can be simulated. The signal noise ratio or the equivalent noise charge can be optimized for preamplifier consisting of charge sensitive amplifier plus shaper. For the device parameter extraction silicon micro strip detectors made of n and p type silicon having high breakdown voltage and being radiation resistive are designed and manufactured, the characteristics before radiation test are shown.
Starting Page	2545
Ending Page	2549
File Size	4998309
Page Count	5
File Format	PDF
ISBN	9781424427147
ISSN	10957863
DOI	10.1109/NSSMIC.2008.4774875
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-19
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	SPICE Radiation detectors Silicon radiation detectors Strips Capacitance Signal to noise ratio Leakage current Electron traps Leak detection Resists Noise Micro strip detector Signal formation
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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