NDLI: De-noising of SPECT images via optimal thresholding by wavelets

Content Provider	IEEE Xplore Digital Library
Author	Noubari, H.A. Fayazi, A. Babapour, F.
Copyright Year	2009
Description	Author affiliation: Faculty of Engineering, Science and Research Branch, Islamic Azad University, P. O. Box 14515-775, Tehran, Iran (Fayazi, A.; Babapour, F.) \|\| Department of Electrical Computer Engineering, University of Tehran, and University of British Columbia (Noubari, H.A.)
Abstract	Single photon emission computed tomography (SPECT) imaging provides functional information and precise physiological uptake of radioactivity in a patient's body. Although SPECT imaging is considered to be highly useful in oncology, but the low signal to noise ratio (SNR) caused by photon noise, introduces considerable compromise in image quality and reduction of diagnostic accuracy. It is necessary to apply appropriate noise reduction algorithm to improve the quality of acquired images. In this paper we have used wavelet based denoising in which PSNAR criteria were utilized to arrive at an optimum thresholding of the coefficient at wavelet domain. We have used SIMIND software for simulation of SPECT images and generation of images using cylindrical jaszak phantom. The images were acquired using one million counts of 64×64 matrix size. In this research, simulated images were utilized to construct data dependent optimum threshold level of wavelet coefficients We have compared the results of our thresholding scheme with those obtained by some of commonly used standard denoising schemes in which we show the use of commonly used wavelet-based denoising leads to an inferior noise reduction results as compared with our optimally searched and derived thresholding.
Starting Page	352
Ending Page	355
File Size	397386
Page Count	4
File Format	PDF
ISBN	9781424432967
ISSN	1557170X
DOI	10.1109/IEMBS.2009.5332777
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-09-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise reduction PSNR Signal to noise ratio Wavelet coefficients Wavelet transforms Single photon emission computed tomography Image quality Wavelet domain Imaging phantoms Image analysis optimal thresholding SPECT wavelet transform denoising
Content Type	Text
Resource Type	Article
Subject	Signal Processing Biomedical Engineering Health Informatics Computer Vision and Pattern Recognition

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