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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Schemm, N. Bo Liang Balkir, S. Hoffman, M.W. Bauer, M. |
| Copyright Year | 2010 |
| Description | Author affiliation: University of Nebraska-Lincoln, Department of Electrical Engineering, 209N SEC, Lincoln, NE 68588-0511, USA (Schemm, N.; Bo Liang; Balkir, S.; Hoffman, M.W.; Bauer, M.) |
| Abstract | This paper presents the design and test results of a computational radiation sensor system based on a single chip solution that can perform standalone gamma isotope identification. A low power sensor front end with a charge sensitive amplifier, an event driven analog-to-digital converter, and a dedicated microcontroller are integrated on the same chip to process and bin the isotope data from a NaI gamma ray detector according to gathered pulse height. This combination effectively implements a single chip multichannel analyzer with the capability to do further processing of the data in software. To that end, a compact fixed-point program was developed to further analyze the pulse height spectra gathered from a variety of gamma ray sources and perform on-chip real-time gamma isotope identification. The design was fabricated in a 0.18 μm CMOS technology with field tests demonstrating the validity of the approaches taken. The total computational sensor system power consumption is less than 30 μW, excluding the detector power consumption. The gamma isotope identification program executes in 70 ms. |
| Starting Page | 2271 |
| Ending Page | 2274 |
| File Size | 356568 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424453085 |
| DOI | 10.1109/ISCAS.2010.5536951 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-05-30 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Sensor systems Isotopes Gamma ray detectors Pulse amplifiers CMOS technology Energy consumption System testing Performance evaluation Analog-digital conversion Microcontrollers |
| Content Type | Text |
| Resource Type | Article |
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