NDLI: Adsorption Filtration Technology Using Reclaimed Iron Sludge Coated Sand Filter Media for Municipal Wastewater Reuse

Content Provider	IEEE Xplore Digital Library
Author	Lü Jianbo Sun Liping Li Yuyou Jia Renyong Yi Xuesong
Copyright Year	2010
Abstract	This paper aims at exploring the feasibility of adsorption filtration technology using reclaimed iron sludge coated sand (RISCS) as filter media for municipal wastewater reuse. The iron sludge as surplus waste solution derived from ferric-carbon micro-electrolysis process. Scanning electron microscope (SEM), Infrared spectroscopy (IR) and X-ray diffraction (XRD) analysis were used to investigate the surface morphology of quartz sand (QS) and RISCS. Batch experiments were performed using QS and RISCS to examine the adsorption isotherms of phosphate and the effect of their dosages on UV254 removal. The results show that RISCS had significantly rougher surfaces, more micropores than QS, and there exist iron oxides (hematite and goethite) on the surface of RISCS. The pHZPC of RISCS was about 7.1, favoring the adsorption of negatively charged particulate onto the RISCS surface. At 20℃, the applicability of the isotherm models for the experimental data follows the order: Freundlich≈Langmuir＞Temkin. The Langmuir adsorption capacity for RISCS and QS was 0.0187mg/g and 0.0039mg/g, respectively. RISCS has a much higher affinity for PO43- than QS. The results of filtration experiments show that, the removal of COD, PO43- and UV254 by RISCS filtration was higher 7.8%, 25.1% and 5.8% than QS filtration, respectively. Effluent quality by RISCS filtration can meet the requirements of (GB/T 18920-2002) in China.
Starting Page	1
Ending Page	4
File Size	732104
Page Count	4
File Format	PDF
ISBN	9781424447121
ISSN	21517622
DOI	10.1109/ICBBE.2010.5515451
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-18
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Scanning electron microscopy Filters Reduced instruction set computing Filtration Surface morphology Iron Surface roughness Rough surfaces Infrared spectra Wastewater
Content Type	Text
Resource Type	Article

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