NDLI: Reliability of quantitative TUG measures of mobility for use in falls risk assessment

Content Provider	IEEE Xplore Digital Library
Author	McGrath, Denise Greene, Barry R. Doheny, Emer P. McKeown, David J. De Vito, Giuseppe Caulfield, Brian
Copyright Year	2011
Description	Author affiliation: School of Public Health, Physiotherapy and Population Science, University College Dublin, Ireland (De Vito, Giuseppe) \|\| TRIL Centre and School of Public Health, Physiotherapy and Population Science, University College Dublin, Ireland (Caulfield, Brian) \|\| TRIL Centre, University College Dublin, Ireland (McGrath, Denise; McKeown, David J.) \|\| TRIL Centre, Intel Labs, Leixlip, Ireland (Greene, Barry R.; Doheny, Emer P.)
Abstract	Recent advances in body-worn sensor technology have increased the scope for harnessing quantitative information from the timed-up-and-go test (TUG), well beyond simply the time taken to perform the test. Previous research has shown that the quantitative TUG method can differentiate fallers from non-fallers with greater success than the manually timed TUG or the Berg Balance Test. In order to advance this paradigm of falls risk estimation it is necessary to investigate the robustness of the quantitative TUG variables. This study investigated the inter-session and intra-session reliability of 44 quantitative TUG variables measured from the shanks and lower back of 33 study participants aged between 55–65 yrs. For intra-session reliability, 25 variables demonstrated excellent reliability (ICC>0.75), and 12 demonstrated “fair to good reliability” with ICCs between 0.4 and 0.75. Analysis of test-retest reliability resulted in ICC > 0.75 for 18 out of 44 variables, with 20 variables showing fair to good reliability. Turn time parameters demonstrated poor reliability. We conclude that this is a reliable instrument that may be used as part of a long-term falls risk assessment, with further work required to improve certain turn parameters.
Starting Page	466
Ending Page	469
File Size	843221
Page Count	4
File Format	PDF
ISBN	9781424441211
ISSN	1557170X
e-ISBN	9781457715891
e-ISBN	9781424441228
DOI	10.1109/IEMBS.2011.6090066
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-08-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Reliability Educational institutions Silicon Instruments Testing Electronic mail Gyroscopes
Content Type	Text
Resource Type	Article
Subject	Signal Processing Biomedical Engineering Health Informatics Computer Vision and Pattern Recognition

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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