NDLI: A scan design method based on two complementary connection styles to minimize test power

Content Provider	IEEE Xplore Digital Library
Author	Ayiao Cui Tingting Yu Mengyang Li Gang Qu
Copyright Year	2015
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA (Gang Qu) \|\| Sch. of Electron. & Inf. Eng., Harbin Inst. of Technol., Shenzhen, China (Ayiao Cui; Tingting Yu; Mengyang Li)
Abstract	Scan design is a good design-for-testability (DfT) discipline but always incurs high power dissipation during test application. Scan cell ordering is a simple yet effective scan path organization method to reduce the test power. In this paper, we propose a new scan chain ordering method based on two complementary scan cell connection styles. To minimize the transitions during the shifting of test data, we evaluate the connection cost between two scan cells based on the exact number of transitions caused by them during test instead of the Hamming distance between their test data. The test power can be minimized as it is proportional to the number of overall transitions. We applied our method on several benchmark circuits. The experimental results show that the scan designs by our method can always achieve the lower test power than those by other existing scan cell ordering methods.
Starting Page	625
Ending Page	628
File Size	480077
Page Count	4
File Format	PDF
ISBN	9781479983919
DOI	10.1109/ISCAS.2015.7168711
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-05-24
Publisher Place	Portugal
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Decision support systems Testing Hafnium Design methodology Integrated circuits Integrated circuit reliability Test Power Complementary Connection Styles Transitions Scan chain ordering
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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