NDLI: A new decompressor with ordered parallel scan design for reduction of test data and test time

Content Provider	IEEE Xplore Digital Library
Author	Tingting Yu Aijiao Cui Mengyang Li Ivanov, A.
Copyright Year	2015
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada (Ivanov, A.) \|\| Sch. of Electron. & Inf. Eng., Harbin Inst. of Technol., Shenzhen, China (Tingting Yu; Aijiao Cui; Mengyang Li)
Abstract	Scan design is regarded as the best design-for-testability (DfT) discipline. High test data volume and long test time are always two major concerns that our work here addresses. Here we combine a test data compression technique and broadcast-based decompressor architecture to relieve these problems. We propose a new decompressor architecture with bidirectional shift register as a source chain to broadcast compressed data into parallel scan chains. It enables one more broadcasting mode which leads to a higher broadcast ratio. We also propose a heuristic method to order the scan cells in each sub scan chain to improve the broadcast ratio so as to reduce the test data and test time. We apply our method on several benchmark circuits and the experimental results show that our method can reduce test data volume by 22.8% and shorten test application time by 19.5% on average with low area overhead in comparison to other state-of-the-art approaches.
Starting Page	641
Ending Page	644
File Size	655045
Page Count	4
File Format	PDF
ISBN	9781479983919
DOI	10.1109/ISCAS.2015.7168715
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-05-24
Publisher Place	Portugal
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Shift registers Clocks Broadcasting Computer architecture Design methodology Multiplexing test application time broadcast ratio decompressor paralll chain test data volume
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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