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A Routability Constrained Scan Chain Ordering Technique for Test
| Content Provider | CiteSeerX |
|---|---|
| Abstract | Abstract — For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation during the physical design stage. In this paper, a scan chain ordering technique for test power reduction under user-specified routability constraints is presented. The proposed technique allows the user to explicitly set the routing constraints and the achievable power reduction is rather insensitive to the routing constraints. The proposed method is applied to six industrial designs. The achievable power reduction is in the range of 37–48% without violating any user-specified routing constraint. I. |
| File Format | |
| Access Restriction | Open |
| Subject Keyword | Routing Constraint Achievable Power Reduction Physical Design Stage High Test Power Consumption Industrial Design Extra Scan Chain Connection User-specified Routability Constraint Routability Degradation Test Power Management Problem User-specified Routing Constraint Test Power Reduction Scan Chain Scan-based Testing |
| Content Type | Text |
