NDLI: Live demonstration: A CMOS ASIC for precise reading of a Magnetoresistive sensor array for NDT

Content Provider	IEEE Xplore Digital Library
Author	Caetano, D.M. Piedade, M. Graca, J. Fernandes, J. Rosado, L. Costa, T.
Copyright Year	2015
Description	Author affiliation: INESC-ID, Lisbon, Portugal (Caetano, D.M.; Piedade, M.; Graca, J.; Fernandes, J.; Rosado, L.; Costa, T.)
Abstract	Non-destructive testing (NDT) based on eddy currents (EC) is commonly used to detect defects in conductive materials. Usually the system includes an emitter coil, and one receiver coil or one Magnetoresistive (MR) sensor. In this work we added an interface ASIC that pre-amplifies and filters the signal from an array of MR sensors. This demo will present a new version based on the work presented at the ECNDT 2014 conference with a paper entitled “A CMOS ASIC for Precise Reading of a Magnetoresistive Sensor Array for NDT”. Since this is an on-going work, improvements have been made, namely the reduction of the system thermal noise to 30 nV/√Hz, the development of a multigain amplifier and the application of the same concept and circuit to a multichannel parallel signal acquisition system. Detection of surface and buried defects will be demonstrated in different material mock-ups.
Starting Page	1906
Ending Page	1906
File Size	985409
Page Count	1
File Format	PDF
ISBN	9781479983919
DOI	10.1109/ISCAS.2015.7169039
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-05-24
Publisher Place	Portugal
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetoresistance Application specific integrated circuits Arrays CMOS integrated circuits Testing Magnetoresistive devices Noise array signal processing eddy current testing (ECT) NDT-wide ASIC CMOS Magnetoresistive sensor
Content Type	Text
Resource Type	Article

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