NDLI: 1 $cm^{2}$ and 3 $cm^{2}$ Multi-Linear Silicon Drift Detectors for 2D X-ray spectroscopic imaging and Compton scattering

Content Provider	IEEE Xplore Digital Library
Author	Castoldi, A. Guazzoni, C. Hartmann, R. Struder, L.
Copyright Year	2009
Description	Author affiliation: Max-Planck Institut Halbleiterlabor, Munich, Germany (Struder, L.) \|\| Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milano, Italy (Castoldi, A.; Guazzoni, C.) \|\| Halbleiterlabor of the Max Planck Institut, Munich, Germany (Hartmann, R.)
Abstract	Multi-Linear Silicon Drift Detectors (ML-SDDs) are a recent evolution of silicon drift detectors, in which the signal electrons generated by the interaction are confined within parallel drifting columns and transported towards point-like anodes by the electrostatic field. ML-SDDs can be operated both in integrate-readout and in free-running mode and are able to provide 2-D position sensing capability combined with spectroscopic energy-resolution. Therefore ML-SDDs open the way to time-resolved imaging and spectroscopy of X-rays and Compton electrons in addition to charged particle tracking. The excellent energy resolution and the relatively small Doppler broadening of silicon makes a ML-SDD detector an ideal candidate to reconstruct the original location of the gamma-ray with sub-millimeter position resolution. Novel designs of 1 $cm^{2}$ and 3 $cm^{2}$ ML-SDDs have been carried out and first detectors prototypes were produced at the Halbleiterlabor of the Max Planck Institut in cooperation with PNSensor GmbH. In this paper we will discuss the main detector performance in terms of position, energy and time resolution.
Starting Page	23
Ending Page	28
File Size	388910
Page Count	6
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5401900
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Silicon Energy resolution Electrons Spectroscopy Signal generators Anodes Electrostatics Optical imaging X-rays
Content Type	Text
Resource Type	Article

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