NDLI: Cross-talk limits of highly segmented semiconductor detectors

Content Provider	IEEE Xplore Digital Library
Author	Pullia, A. Weisshaar, D. Zocca, F. Bazzacco, D.
Copyright Year	2009
Description	Author affiliation: University of Koeln, Germany (Weisshaar, D.) \|\| University of Milan and Istituto Nazionale di Fisica Nucleare, Milano, Italy (Pullia, A.; Zocca, F.) \|\| Istituto Nazionale di Fisica Nucleare, Padova, Italy (Bazzacco, D.)
Abstract	Cross-talk limits of monolithic highly-segmented semiconductor detectors for high-resolution X-gamma spectrometry are investigated. Cross-talk causes false signal components yielding amplitude losses and fold-dependent shifts of the spectral lines, which partially spoil the spectroscopic performance of the detector. Two complementary electrical models are developed, which describe quantitatively the interchannel cross-talk of monolithic segmented detectors whose electrodes are read out by charge-sensitive preamplifiers. The first is here designated as Cross-Capacitance (CC) model, the second as Split-Charge (SC) model. The CC model builds around the parasitic capacitances C linking the preamplifier outputs and the neighbor channel inputs. The SC model builds around the finite-value of the decoupling capacitance C used to read out the high-voltage detector electrode. The key parameters of the models are individuated and ideas are shown to minimize their impact. Using a quasi-coaxial germanium segmented detector it is found that the SC cross-talk becomes negligible for decoupling capacitances larger than 1 nF, where instead the CC cross-talk tends to dominate. The residual cross-talk may be reduced by minimization of stray capacitances C, through a careful design of the layout of the Printed Circuit Board (PCB) where the input transistors are mounted. C can be made as low as ~5 fF, but it is shown that even in such case the impact of the CC cross-talk on the detector performance is not negligible. Finally, an algorithm for cross-talk correction is presented and elaborated.
Starting Page	1707
Ending Page	1711
File Size	470935
Page Count	5
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5402224
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Spectroscopy Electrodes Preamplifiers Parasitic capacitance Performance loss Joining processes Germanium Minimization Printed circuits
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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