NDLI: Dual energy CT material decomposition from inconsistent rays (MDIR)

Content Provider	IEEE Xplore Digital Library
Author	Maas, C. Grimmer, R. Kachelries, M.
Copyright Year	2009
Description	Author affiliation: Institute of Medical Physics (IMP), University of Erlangen- Nürnberg, Henkestr. 91, 91052 Erlangen (Maas, C.; Grimmer, R.; Kachelries, M.)
Abstract	In dual energy CT (DECT) the object is scanned with two different detected spectra in order to provide material — selective or energy-selective images of the object. Thereby, generally a higher order correction of beam hardening artifacts than it can be applied to usual single energy scans is possible. All known methods to do that need to combine the sinograms in rawdata space before image reconstruction. Therefore, a precondition of those methods is that geometrically identical rays are measured for each sinogram (consistent rays). However, most CT scanners actually acquire inconsistent rays in the sense that geometrically different rays are measured for each spectrum. Then the possibility of higher order beam hardening corrections remains unused and the resulting dual energy specific images show significantly reduced quality. We propose an iterative algorithm for material decomposition from inconsistent rays (MDIR) that allows even in the case of inconsistent rays to reconstruct material-selective or energy-selective images that are almost free of beam hardening artifacts. The algorithm is assessed using simulated data without noise (to enhance the visibility of beam hardening artifacts) and a micro CT scan of a mouse. The simulation studies find that the method is able to completely remove beam hardening caused image quality degradation after few (two to four) iterations. For the mouse scan an improvement in image quality can be noticed. In any case MDIR succeeds in reducing image artifacts that origin from beam hardening considerably while the image noise remains constant.
Starting Page	3446
Ending Page	3452
File Size	798926
Page Count	7
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5401784
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Computed tomography Image reconstruction Mice Image quality Object detection Iterative algorithms Attenuation Raw materials Nuclear and plasma sciences Degradation inconsistent rays dual energy CT material decomposition beam hardening image quality
Content Type	Text
Resource Type	Article

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