NDLI: Feasibility study: Low-cost dual energy CT for security inspection

Content Provider	IEEE Xplore Digital Library
Author	Yuanyuan Liu Jianping Cheng Zhiqiang Chen Yuxiang Xing
Copyright Year	2009
Description	Author affiliation: Department of Engineering Physics, Tsinghua University and Key Laboratory of Particle & Radiation Imaging (Tsinghua University), Ministry of Education, Beijing, P. R. China, 100084 (Yuanyuan Liu; Jianping Cheng; Zhiqiang Chen; Yuxiang Xing)
Abstract	Dual energy CT (DECT) has become a hot topic among security inspection recently for its high detection precision and robust material identification ability. Currently, in one typical realization of DECT, two sets of detectors are needed. However, the high cost of the system become a big limitation for its wide usage. Moreover, in some particular situation, the detective objects detected in security inspection with regular shapes and thicknesses don't need complete sampling to reconstruct. Therefore, a new idea of system setup, dual energy CT with reduced data system (DECT-RDS), only a few detector bins instead of complete-sample bins of the second high energy set which can greatly reduced the cost, had been created. And then, we proposed a new dual energy CT reconstruction method with reduced data (DECT-RD) requiring much fewer data to reduce the cost of detectors. In this paper, to fully investigate the feasibility of its application in security inspection, we are developing such an experimental imaging system (DECT-RDS). Practical experiments are done by using only 20% detector bins instead of complete-sample bins in each projection. Results give a relative error less than 5% between complete sampling and undersampling. The results demonstrated that detector bins can be greatly reduced in dual energy CT imaging, hence much lower the system cost. We believe this type of system configuration will drive DERT into wide practical applications.
Starting Page	879
Ending Page	882
File Size	274274
Page Count	4
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5402473
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Inspection Computed tomography Detectors Costs Object detection Data security Sampling methods Robustness Shape Image reconstruction security inspection X-ray tomographic imaging dual energy CT undersampling system
Content Type	Text
Resource Type	Article

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