NDLI: The silicon tracker of the CBM experiment at FAIR: Detector developments and first in-beam characterizations

Content Provider	IEEE Xplore Digital Library
Author	Lymanets, A. Chatterji, S. Heuser, J.M.
Copyright Year	2009
Description	Author affiliation: Frankfurt Institute for Advanced Studies, Frankfurt am Main, Germany (Lymanets, A.) \|\| GSI Hemholtz Center for Heavy Ion Research, Darmstadt, Germany (Chatterji, S.; Heuser, J.M.)
Abstract	The Silicon Tracking System (STS) is a key detector of the CBM experiment planned at the Facility for Antiproton and Ion Research (FAIR). It has to reconstruct the trajectories of hundreds of charged particles created in heavy-ion collisions at typical beam energies of 25 GeV/nucleon. Radiation hard sensors and fast read out electronics are needed to match the interaction rates of up to 10 MHz. A low-mass detector system is required for a momentum measurement with about 1% resolution. First double-sided silicon microstrip detector prototypes with 50 μm strip pitch developed together with CiS, Germany have been characterized in the laboratory and several in-beam tests. In a full read-out chain based on self-triggering front-end electronics they were operated at GSI in a 2 GeV proton beam. A demonstrator tracking station was integrated into the beam tracker of the SVD-2 experiment at IHEP, Protvino, Russia and tested in a 50 GeV proton beam. The CBM experiment will operate with a high-intensity DC beam at the FAIR synchrotron SIS-300. Fast front-end electronics and a high-throughput data acquisition system are required. The self-triggering n-XYTER read-out chip with 128 channels is being explored in the prototype system tests. We present results on the detector response and the behavior of front-end electronics in a full data acquisition chain. The high-radiation environment in the CBM experiment results in a particle fluence through the STS of up to $10^{15}$ 1-MeV $n/cm^{2}$ per year. We present measurements of double-sided silicon microstrip detectors as well as PiN diodes irradiated up to $10^{14}$ 1-MeV $n/cm^{2}$ and compare them to non-irradiated samples.
Starting Page	1689
Ending Page	1691
File Size	510861
Page Count	3
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5402236
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Detectors Particle beams Sociotechnical systems Microstrip Prototypes Testing Data acquisition Sensor phenomena and characterization Strips
Content Type	Text
Resource Type	Article

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