NDLI: A new method for cupping and scatter precorrection for flat detector CT

Content Provider	IEEE Xplore Digital Library
Author	Grimmer, R. Maass, C. Kachelriess, M.
Copyright Year	2009
Description	Author affiliation: Institute of Medical Physics (IMP), University of Erlangen-Nu¿rnberg, Henkestr. 91, 91052 Erlangen (Grimmer, R.; Maass, C.; Kachelriess, M.)
Abstract	Scatter and beam hardening are prominent artifacts in x-ray CT. Currently, there is no precorrection method that inherently accounts for tube voltage modulation and shaped prefiltration. We generalized a method for self-calibration based on binary tomography of homogeneous objects [1] to use this information to preprocess scans of other, non-binary objects, e.g. to reduce artifacts in medical CT applications. Further on we extended the method to handle not only beam hardening but also scatter and to allow for detector pixel-specific precorrections. This implies that our calibration technique handles varying tube voltage and shaped prefiltration. We propose a method that models the beam hardening correction by using a rational function while the scatter component is modeled using the pep-model. A smoothness constraint is applied to the parameter space to regularize the underdetermined system of non-linear equations. The parameters determined are then used to precorrect CT scans. Our algorithm was evaluated using simulated data of a flat panel cone-beam CT scanner with tube voltage variation and bow-tie prefiltration and real data of a flat detector cone-beam CT scanner. In simulation studies our correction model proved to be nearly perfect and the algorithm showed its abilities by correcting the beam hardening and scatter effects. Reconstructions of measured data showed significantly less artifacts than the standard reconstruction.
Starting Page	3517
Ending Page	3522
File Size	879333
Page Count	6
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5401805
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Scattering Detectors Computed tomography Voltage Image reconstruction Calibration Q measurement Shape Attenuation Nuclear and plasma sciences image correction Computed tomography (CT) beam hardening scatter cupping
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A new x-ray scatter correction method based on BAG for cone beam CT

Empirical cupping correction for CT scanners with tube voltage modulation (ECCU)

A hybrid scatter correction method for cone-beam CT

Empirical water precorrection for cone-beam computed tomography

A method for simultaneous image reconstruction and beam hardening correction

Empirical cupping correction for CT scanners with primary modulation (ECCP)

Penalized-likelihood sinogram restoration for CT artifact correction

Analysis of the impact of CT based attenuation correction, scatter compensation and 3D-beam modeling on SPECT image quality

A method for calibrating 3D PET without scatter correction

A new method for cupping and scatter precorrection for flat detector CT

Similar Documents

A new x-ray scatter correction method based on BAG for cone beam CT

Empirical cupping correction for CT scanners with tube voltage modulation (ECCU)

A hybrid scatter correction method for cone-beam CT

Empirical water precorrection for cone-beam computed tomography

A method for simultaneous image reconstruction and beam hardening correction

Empirical cupping correction for CT scanners with primary modulation (ECCP)

Penalized-likelihood sinogram restoration for CT artifact correction

Analysis of the impact of CT based attenuation correction, scatter compensation and 3D-beam modeling on SPECT image quality

A method for calibrating 3D PET without scatter correction

A new method for cupping and scatter precorrection for flat detector CT