NDLI: Time-resolved X-ray spectroscopic imaging with novel silicon drift detectors

Content Provider	IEEE Xplore Digital Library
Author	Castoldi, A. Galimberti, A. Guazzoni, C. Struder, L.
Copyright Year	1963
Abstract	This paper describes recently developed Silicon Drift Detectors dedicated to high resolution time- and energy-resolved X-ray imaging. We will discuss the design features and performances of the Controlled Drift Detector (CDD), a new detector topology featuring 2-D position sensing and energy spectroscopy of X-rays in the range 1-20 keV with a frame rate up to 100 kHz. In addition we will discuss the potential application of Multi-Linear Silicon Drift Detectors to high resolution X-ray spectroscopy at high counting rates. These detectors feature parallel columns permanently biased in drifting mode and a topology particularly suitable to optimize the signal-to-noise ratio of the readout section. Examples of radiographic images and tomographic 2-D and 3-D reconstructions of phantoms and biological samples acquired at 300 K at Sincrotrone Trieste are shown together with the spectroscopic analysis of each pixel. The timing capability of the CDD has been successfully tested by imaging the X-rays shaped by a mask vibrating at acoustic frequency with a time resolution down to 10 mus
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	373
Ending Page	377
Page Count	5
File Size	1021245
File Format	PDF
ISSN	00189499
Volume Number	53
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray imaging Spectroscopy Optical imaging Silicon X-ray detection X-ray detectors Energy resolution Image resolution Topology High-resolution imaging X-ray spectroscopy Controlled-drift detector fast readout high-resolution energy-resolved X-ray imaging silicon drift detector time-resolved X-ray imaging 2-D and 3-D tomography
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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