NDLI: Fast high lutetium content scintillators as candidates for APD-based phoswich detectors with depth-of-interaction (DOI)

Content Provider	IEEE Xplore Digital Library
Author	Pepin, C.M. Bergeron, M. Shimizu, S. Viscogliosi, N. Thibaudeau, C. Fontaine, R. Lecomte, R.
Copyright Year	2009
Description	Author affiliation: Hitachi Chemical Co., Ltd, Ibaraki, 312-0003, Japan (Shimizu, S.) \|\| Department of Electrical and Computer Engineering, Université de Sherbrooke, Sherbrooke, QC, Canada J1K 2R1 (Viscogliosi, N.; Thibaudeau, C.; Fontaine, R.) \|\| Department of Nuclear Medicine and Radiobiology, Université de Sherbrooke, and the Sherbrooke Molecular Imaging Center, Sherbrooke, QC, Canada J1H 5N4 (Pepin, C.M.; Bergeron, M.; Lecomte, R.)
Abstract	The recent introduction of several new fast, high light yield versions of generic cerium-doped lutetium silicates (LSO, LGSO, LYSO…) has widened the list of potential candidates for phoswich detectors dedicated to medical imaging applications. Furthermore, digital signal processing methods based on adaptive filter theory now provide powerful approaches for crystal identification, even with scintillators having small decay time differences (Δτ). The LabPET™ digital signal processing technology was used to investigate the crystal identification performance of phoswich scintillator pairs with decay times in the range of 32 to 77 ns. The scintillator initial photon emission rate 70 was found to directly impact the identification error rate, particularly for fast phoswich crystal pairs with small Aτ. Overall, error rates of less than 10% were measured for phoswich pairs with Ατ > 5 ns and less than 1 % for Aτ > 20 ns, which is fully adequate for typical PET imaging applications.
Starting Page	2427
Ending Page	2433
File Size	734861
Page Count	7
File Format	PDF
ISBN	9781424439614
ISSN	10957863
DOI	10.1109/NSSMIC.2009.5402140
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-24
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Photonic crystals Assembly Positron emission tomography Biomedical imaging Digital signal processing Error analysis High-resolution imaging Optical imaging Mathematical model
Content Type	Text
Resource Type	Article

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