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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jain, S. Jiming Song Kamgaing, T. Mekonnen, Y. |
| Copyright Year | 2011 |
| Description | Author affiliation: Department of Electrical and Computer Engineering Iowa State University, 2130 Coover Hall, Ames, IA-50011, USA (Jain, S.; Jiming Song) || Intel Corporation, Chandler, AZ-85226, USA (Kamgaing, T.; Mekonnen, Y.) |
| Abstract | An equivalent model for a lossy shielded microstrip line on layered media is constructed by replacing the layered media with a single effective medium and a detailed analysis of its validity at different frequencies and different range of dimensions has been presented for application to on chip interconnects. The relative permittivity for a single layer microstrip which results in the same propagation constant for the dominant mode as the layered one at a given frequency is considered to be the equivalent. The results show that this model is frequency independent for layered structures when the given frequency and frequency of operation are less than the transition frequency (i.e. the frequency at which there is a significant change in the equivalent dielectric constant (∊req)). For frequencies higher than the transition frequency the equivalent model is not frequency independent but it gives good results for the higher order mode although it is derived using the dominant mode. Also it is seen that at low frequency ∊req depends on the layers near to the signal metal but at higher frequencies it depends on the layer with the highest value of ∊r irrespective of its location w.r.t to the metal strip. |
| Starting Page | 195 |
| Ending Page | 201 |
| File Size | 1357059 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781612844978 |
| ISSN | 05695503 |
| e-ISBN | 9781612844985 |
| e-ISBN | 9781612844961 |
| DOI | 10.1109/ECTC.2011.5898513 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-05-31 |
| Publisher Place | Florida, USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Microstrip Metals Dielectric losses Propagation constant Conductivity Testing Dielectric constant |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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