NDLI: Decoupled victim model for the analysis of crosstalk noise between on-chip coupled interconnects

Content Provider	IEEE Xplore Digital Library
Author	Palit, A.K. Hasan, S. Anheier, W.
Copyright Year	2009
Description	Author affiliation: FB1/ITEM, University of Bremen, P.O. Box - 330 440, 28 334 Bremen, Germany (Palit, A.K.; Hasan, S.; Anheier, W.)
Abstract	Crosstalk noise due to parasitic couplings between two closely located neighboring wires has significant impact on the performance of the high speed DSM chips. Analysis of crosstalk effect using a single wire with all of its coupling parameters is much easier and very convenient for determining the maximum effect of the crosstalk noise both in terms of glitch and delay. With this objective, in this paper a decoupled and distributed RLGC transient model of the victim wire is introduced which takes into account all coupling effects and is very fast, highly flexible and yet accurate enough. Using this decoupled victim model also some analytical or numerical approaches for determining the critical values of influencing parameters can be developed. The efficacy of the decoupled victim model is also compared with the coupled two interconnects' PSPICE and MATLAB simulation results, which show comparable performance for the model's accuracy but significantly superior performance for simulation speed.
Starting Page	697
Ending Page	701
File Size	528235
Page Count	5
File Format	PDF
ISBN	9781424450992
e-ISBN	9781424451005
DOI	10.1109/EPTC.2009.5416461
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-12-09
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Coupled mode analysis Crosstalk Mathematical model Integrated circuit interconnections Mutual coupling Wire Inductance Capacitance Delay effects Voltage
Content Type	Text
Resource Type	Article

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