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Content Provider | IEEE Xplore Digital Library |
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Author | Rami, S. Paganini, A. Eisenstadt, W.R. |
Copyright Year | 2010 |
Description | Author affiliation: University of Florida, ECE, University of Florida, Gainesville, FL, 32607 (Rami, S.; Eisenstadt, W.R.) || IBM System & Technology Group, 1000 River Street, Essex Junction, VT, 05452 (Paganini, A.) |
Abstract | Differential circuits, employed to alleviate performance trade-offs associated with increased levels of system integration, demand leading edge solutions to address testing limitations. As a result, a differential, wideband amplitude detector suitable for built-in-self-test (BIST) applications at RF to millimeterwave (mm-Wave) frequencies is presented. For compatibility with BIST methodologies, a comprehensive analysis, lacking in previous literature, simplifies and classifies the detector's response into a known type (RMS, Peak) depending on certain operating conditions (operating region, input signal level). Additionally, another novel concept of cross-mode detection error is introduced to supplement characteristics of the differential detector. The detector was implemented in a BiCMOS IBM8HP process and two design variants were characterized. A BJT version features a bandwidth between 100MHz and 17.5GHz. The second design added few improvements to the original topology; innovative common-mode detection capability was included with minimal loading effects to the device-under-test (DUT), the circuit was migrated to MOS transistors, and the bandwidth was extended to 70GHz. Both versions (BJT and MOS) occupy a core area smaller than $0.045mm^{2},$ with a static power consumption as low as 8μW and exhibit a dynamic range of at least 30dB. |
Starting Page | 735 |
Ending Page | 743 |
File Size | 823547 |
Page Count | 9 |
File Format | |
ISBN | 9781424464104 |
ISSN | 05695503 |
e-ISBN | 9781424464128 |
e-ISBN | 9781424464111 |
DOI | 10.1109/ECTC.2010.5490758 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-06-01 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Minimally invasive surgery Wideband Detectors Built-in self-test Circuit testing Bandwidth System testing Radio frequency Signal analysis BiCMOS integrated circuits |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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